Statistical analysis of subthreshold leakage current for VLSI circuits
نویسندگان
چکیده
منابع مشابه
Statistical Analysis of the Accuracy of Current-Mirror Structures Keywords: Current-Mirrors, Statistical Analysis, Analog VLSI circuits
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ژورنال
عنوان ژورنال: IEEE Transactions on Very Large Scale Integration (VLSI) Systems
سال: 2004
ISSN: 1063-8210,1557-9999
DOI: 10.1109/tvlsi.2003.821549